[root@localhost HetmanNet]# smartctl -a /dev/sdb
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.5.7-202.fc23.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family:     Western Digital Blue Mobile
Device Model:     WDC WD7500LPCX-60KHST0
Serial Number:    WD-WXB1A254DFV7
LU WWN Device Id: 5 0014ee 65b394d85
Firmware Version: 01.01A01
User Capacity:    750 156 374 016 bytes [750 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-2 (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Mon Jul 18 13:46:44 2016 EEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                (11700) seconds.
Offline data collection
capabilities:                    (0x51) SMART execute Offline immediate.                                                                                                
                                        No Auto Offline data collection support.
                                        Suspend Offline collection upon new
                                        command.
                                        No Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 135) minutes.
SCT capabilities:              (0x703d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   197   182   051    Pre-fail  Always       -       8573
  3 Spin_Up_Time            0x0027   188   186   021    Pre-fail  Always       -       1575
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       136
  5 Reallocated_Sector_Ct   0x0033   133   133   140    Pre-fail  Always   FAILING_NOW 2834
  7 Seek_Error_Rate         0x002f   157   157   051    Pre-fail  Always       -       1166
  9 Power_On_Hours          0x0032   098   098   000    Old_age   Always       -       1580
 10 Spin_Retry_Count        0x0033   100   100   051    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0032   100   253   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       31
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0033   100   100   097    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   078   001   000    Old_age   Always       -       8621
188 Command_Timeout         0x0032   066   001   000    Old_age   Always       -       304947405312
190 Airflow_Temperature_Cel 0x0022   066   052   040    Old_age   Always       -       34 (Min/Max 34/34)
191 G-Sense_Error_Rate      0x0032   001   001   000    Old_age   Always       -       3919
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always       -       9
193 Load_Cycle_Count        0x0032   187   187   000    Old_age   Always       -       39358
194 Temperature_Celsius     0x0022   113   099   000    Old_age   Always       -       34
196 Reallocated_Event_Count 0x0032   061   061   000    Old_age   Always       -       139
197 Current_Pending_Sector  0x0032   200   199   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   100   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0009   100   253   051    Pre-fail  Offline      -       0
SMART Error Log Version: 1
ATA Error Count: 3
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 1253 hours (52 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 61 46 00 00 00 e0  Device Fault; Error: ABRT
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ef 03 46 00 00 00 e0 00   6d+08:33:16.692  SET FEATURES [Set transfer mode]
  ec 00 01 00 00 00 e0 00   6d+08:33:16.692  IDENTIFY DEVICE
Error 2 occurred at disk power-on lifetime: 1253 hours (52 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 61 03 00 00 00 a0  Device Fault; Error: ABRT
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ef 90 03 00 00 00 a0 00   6d+08:32:16.561  SET FEATURES [Disable SATA feature]
  ef 02 00 00 00 00 a0 00   6d+08:32:16.561  SET FEATURES [Enable write cache]
Error 1 occurred at disk power-on lifetime: 1253 hours (52 days + 5 hours)
  When the command that caused the error occurred, the device was active or idle.
  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 61 00 00 00 00 a0  Device Fault; Error: ABRT
  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ef 02 00 00 00 00 a0 00   6d+08:32:16.561  SET FEATURES [Enable write cache]
SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.